Cornell University
Search Cornell
VIVO: Cornell Research & Scholarship
Index
Log in
Search form
Home
People
Organizations
Research
Events
THREE-DIMENSIONAL AND SPECTROSCOPIC CHARACTERIZATION OF DEVICES AT THE ATOMIC SCALE USING ABERRATION-CORRECTED ELECTRON TOMOGRAPHY
Overview
Time
Identity
Other
View All
Overview
administered by
Applied and Engineering Physics (A&EP)
grant awarded by
SEMICONDUCTOR RESEARCH CORP
Time
date/time interval
October 1, 2008 - December 31, 2012
Identity
local award id
54504
Other
award status
ASAP
sponsor level one
SRC
