Marohn, John A.

Associate Professor

research

research and scholarship focus

  • Investigations of mesoscale and nanoscale materials by novel scanned- probe microscopies
  • Formulate new techniques more capable of answering both fundamental and applied questions in mesoscale and nanoscale materials
  • Scanned-probe microscopes

affiliations

faculty appointment in

member of graduate field

other Cornell affiliations

background

educational background

  • PhD, California Institute of Technology, 1996
  • BS, University of Rochester, 1989
  • BA, University of Rochester, 1989

awards and distinctions

  • NSF Career Award 2002

featured in

publications

selected publications (listing in progress)

Ng, T.N.; Silveira, W.R., Marohn, J.A. The Dependence of Charge Injection on Temperature, Electric Field, and Energetic Disorder in an Organic Semiconductor. Physical Review Letters, 2007, 98, 066101.

Kuehn, S.; Loring, R.F., Marohn, J.A. Dielectric Fluctuations and the Origins of Non-Contact Friction. Physical Review Letters, 2006, 96, 156103.

Muller, E.M. and Marohn, J.A. Microscopic evidence for spatially inhomogeneous charge trapping in pentacene. Advanced Materials, 2005, 17 (11), p. 1410-1414.

Garner, S.R., Kuehn, S.; Dawlaty, J.M.; Jenkins, N.E.; Marohn, J.A. Force-gradient detected nuclear magnetic resonance. Applied Physics Letters, 2004, 84, 5091.

Silveira, W.R., Marohn, J.A. Microscopic View of Charge Injection in an Organic Semiconductor. Physical Review Letters, 2004, 93 (11), 116104.